Michał Obara, PhD student at the IMPET project, gave a presentation at the IEEE EUROCON 2025 – 21st International Conference on Smart Technologies held in Gdynia, June 4–6, 2025.
His talk focused on simulating coincidence events in the Siemens Biograph Vision Quadra PET scanner using the GATE Monte Carlo toolkit and the development of a dedicated labelling procedure to classify events into true, phantom scatter, detector scatter, and random categories. The resulting labelled datasets form the basis for applying machine learning methods to event-level classification, aiming to improve scatter and random correction in Siemens Biograph Vision Quadra PET imaging.
